FARRUKH, F.; HAFI, S.-. e-.; FAROOQ, R.; FARAHANI, M. R. Calculating Some Topological Indices of SiO\(_2\) Layer Structure. Journal of Informatics and Mathematical Sciences, [S. l.], v. 8, n. 3, p. 181–187, 2016. DOI: 10.26713/jims.v8i3.445. Disponível em: http://rgnpublications.com/journals/index.php/jims/article/view/445. Acesso em: 22 nov. 2024.